OLYMPUS Cantilevers

OLYMPUS Micro Cantilever AC 160BN

Olympus cantilever with tetrahedral blade like high aspect ratio tip. Suitable for all oscillating cantilever AFM techniques like TappingMode(TM) or non-contact mode. Sidewall angles >85º can be measured perpendicular to the cantilever axis. Due to the special orientation of the tetratip the high aspect portion of the tip reaches high sidewall angles even in the direction parallel to the tip considering the 10-12º mounting angle of the cantilever substrate.

Main features:

• Resonance frequency 300 kHz, spring constant 42 N/m.
• Tip radius < 10 nm for highest resolution imaging.
• Olympus Blade Tetra Tip with high aspect end portion of approximately 2 micrometer.
• Tip is located exactly at the cantilever end allowing for precise optical pre-positioning of the tip with respect to features of interest on the sample.